Signal Integrity

Signal integrity covers all the issues about single ended and differential signal propagation from the transmitter to the receiver, including problems such as impedance control, discontinuities, reflections, topology, terminations, losses, ISI, jitter, eye diagrams, cross talk and ground bounce.

ARTICLES

New High-performance Oscilloscope From Rohde & Schwarz

Innovative Signal Integrity, Measurement Speed and Range of Functions

Rohde & Schwarz introduced the new high-performance R&S RTP oscilloscope. During the development of the new oscilloscope family, the focus was on measurement accuracy, speed, a wide range of functions and future-proof technology.


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Ixia to Demonstrate the Industry’s Highest Density and Space Saving 400GE Test Solution at Interop Tokyo

AresONE-400G Named Best in Show Finalist at Interop Tokyo

Keysight Technologies, Inc. today announced that the company will demonstrate AresONE-400G at Interop Toyko (booth 4Y16) to be held June 13-15 at Makuhari Messe in Chiba, Japan. AresONE-400G is the first high-density 8-port 400 gigbit Ethernet (GE) test system in a 2 rack-unit (RU) fixed chassis based on 56Gb/s electrical interface with PAM-4 encoded signaling.


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Keysight Technologies' Delivers New USB Measurement Platform that Increases Efficiency in Design, Test, and Analysis

Streamline Series USB Platform offers advanced capabilities with zero compromises

Keysight Technologies, Inc. announced today a new measurement platform that ensures consistent, repeatable results across all phases of design. The new Keysight Streamline Series is comprised of compact USB instruments: vector network analyzers (VNAs), oscilloscopes and an arbitrary waveform generator (AWG) that leverage trusted Keysight technologies, measurement algorithms, and application software.


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Maxim Provides Industry’s First True Fault Protection Solution for High-Speed USB Ports and Industrial Voltage Applications

With the MAX22505 ±40V high-speed USB fault protector from Maxim Integrated Products, Inc., designers can now eliminate USB port damage from all faults, including ground potential differences, up to ±40V without the tradeoffs required by competing solutions. It protects data and power lines from industrial equipment powered at 24VAC and 40VDC, while also reducing solution size by more than 50% for industrial voltage applications.


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Microwave-Based Test Method Can Help Keep 3-D Chip Designers’ Eyes Open

Researchers at the National Institute of Standards and Technology (NIST) have invented a new approach to testing multilayered, three-dimensional computer chips that are now appearing in some of the latest consumer devices. The new method may be the answer the semiconductor industry needs to quickly assess the reliability of this relatively new chip construction model, which stacks layers of flat circuitry atop one another like floors in a building to help make chips ever-faster and packed with features.


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Keysight Santa Rosa Headquarters Resumes Operations

Keysight Technologies' corporate headquarters in Santa Rosa, California has resumed operations after being temporarily closed due to the wildfires in Northern California. All four main buildings at the site are intact, and the majority of production facilities are back in operation, according to the company. Keysight affirmed the fourth quarter 2017 financial guidance provided in its third quarter earnings release on August 30, 2017.


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IMAGE GALLERIES

DesignCon 2018

Santa Clara, CA

EVENTS

Trade shows

ECOC 2018

9/23/18 to 9/27/18
Rome
Italy

2018

 

 

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Trade shows

EPEPS Conference 2018

10/14/18 to 10/17/18
San Jose, CA
United States

Trade shows EDI CON

EDI CON USA 2018

10/17/18 to 10/18/18
Santa Clara Convention Center
Santa Clara, CA
United States
Contact: Alyssa Connell

DOCUMENTS AND FILES

Power-Aware Analysis Solution

By reviewing the classic (or traditional) SI methodology, analyzing high-speed design flows, and examining what is employed in Cadence® Sigrity™ power and signal simulations using the SPEED2000™, PowerSI®, Transistor-to-Behavioral Model Conversion (T2B™), and SystemSI™ tools, this paper explains how a general power-aware SI solution not only should be capable of performing SSN simulations, but also capable of creating and extracting signal and power analysis-required models and running design checks with power-aware constraints. Providing such a complete, or true, “power-aware solution” gives designers the confidence to produce high-quality designs.

Cadence: Addressing the “Power-Aware” Challenges of Memory Interface Designs

One of the toughest challenges in designing memory interfaces is accurately measuring timing while also considering fluctuations in power and ground rails due to simultaneously switching signals. Signal integrity (SI) engineers are increasingly insisting on “power-aware” SI analysis, where the effects of signal and non-ideal power/ground are considered when analyzing highspeed memory interfaces. This paper assesses how modern tools can be used to address poweraware SI challenges associated with I/O modeling, interconnect modeling, simulation, and analysis.

Quick Start for Signal Integrity Design Using Keysight Advanced Design System (ADS)

A quick overview of how to download and use Signal Integrity Design Using Keysight Advanced Design System (ADS) including examples.

Using ADS for Signal Integrity Optimization

In the beginning there was transient simulation. Ensuring functional chip-to-chip links in a system meant performing a time-domain simulation with a SPICE simulator. The result was a time-domain waveform that was evaluated during post processing for signal integrity (SI). The main task was to measure the eye diagram, usually assuming a perfect clock as the phase reference. Due to rising signaling speeds and decreasing timing margins, the task was made more challenging when it became necessary to account for other effects.

PAM-4 Simulation to Measurement Validation with Commercially Available Software and Hardware

Next-generation of OIF and IEEE signaling standards are seriously considering PAM-4 signaling at 56 Gb/s over electrical channels. To exploit the advantages of PAM-4 signaling, a new measurement and simulation eco-system must be established and validated. Simulation of PAM-4 signals are done with an IBIS-AMI signal generator, an S-parameter channel model, and remote access software for receiver data recovery. Measured data is from commercially available PAM-4 generators, QSFP28 Ethernet cable assemblies, and digital oscilloscope receivers with specialized waveform processing. This paper will present correlation data to validate the software and hardware tools necessary for fast-track deployment in upcoming PAM-4 applications.

8 Ways to Overcome SI and PI Challenges

Keysight ADS 2016 features a host of new, technologies designed to improve productivity, including two electromagnetic (EM) software solutions specifically created to help signal and power integrity engineers improve high-speed link performance in PCB designs. What follows is a listing of 8 ways in which ADS 2016 can help you, the engineer, overcome your signal and power integrity challenges.

ANSYS-Near End and Far End Crosstalk Scanner

Crosstalk, or coupling, in high speed printed circuit board and packages represent one of main signal integrity design challenges. The cost of failure is very high and requires careful design strategies. This application note will introduce the capabilities for SIwave to automatically, and quickly, scan the entire PCB or package layout and report Near and Far End crosstalk coefficients

ANSYS-CPM model for Transient Analysis

Power Delivery Network(PDN) time domain noise analysis is an essential part for SI/PI/EMI analysis, SIwave can utilize CPM’s current PWL file as a current sink for transient analysis combed with C4 bump’s RLC parasitics to give more realistic and accurate noise value.