Educational eBooks

Please note:
By downloading an eBook, the details of your profile will be shared with the sponsoring company and you may be contacted by them directly
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Oscilloscope Measurement Guide
*Includes two SIJ articles that were handpicked by the editor of MWJ (SIJ's sister publication)

This eBook covers some key applications where oscilloscopes are best suited to make the important measurements to evaluate your designs. The articles cover practical printed circuit board design and manufacture to reduce noise; triggering on radar RF pulses with an oscilloscope; demodulating radar RF pulses with an oscilloscope; low noise, sub-milliOhm measurements in very small circuits; and power integrity measurements.

Please note:
By downloading this eBook, your contact information will be shared with the sponsoring company, Rohde & Schwarz GmbH & Co.KG and the Rohde & Schwarz entity or subsidiary company mentioned in the imprint of rohde-schwarz.com, and you may be contacted by them directly via email or phone for marketing or advertising purposes.

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SIJ July 2019 Issue, "Why Are There So Many Standards?"
Subscribe to download this issue of Signal Integrity Journal featuring articles from industry experts including:

  • Jay Diepenbrock (SIRF Consultants, LLC)
  • Sanjeev Gupta (Intel Corp)
  • Bill Hargin (Z-zero) & Don DeGroot (CCN)
  • Al Horn (Rogers Corp)
  • Bert Simonovich (LAMSIM Enterprises Inc.)
  • Gary Giust (SiTime)
  • Istvan Novak (Samtec)
  • Steve Sandler (Picotest)
  • Ken Wyatt (Wyatt Technical Services LLC)

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Oscilloscope Measurements Guide
Sponsored by Rohde & Schwarz

This is the first co-contributed eBook with articles from both Microwave Journal and Signal Integrity Journal as the versatile oscilloscope is used for measurements for wireless and high-speed circuits. This eBook covers how phase-locked loops enable many applications and simplify calibration with phase resynchronization & phase adjustment, an easy and simple way to measure the bandwidth of a scope-probe system, tackling power distribution network issues, accurate & fast power integrity measurements, avoiding artifacts when measuring switch-mode power supplies, PAM4 measurements & challenges, and ground bounce & how to accurately measure & avoid it. 

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PAM4/Bit Error Rate Testing
Sponsored by Anritsu

For engineers wading into the waters of higher data rates and PAM4, this special issue of Signal Integrity Journal on PAM4/BER and related topics, sponsored by Anritsu, brings some of the most recent pieces on these topics into one collection. 

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SIJ January 2019 Issue, "Power Integrity Challenges"
Register to download this issue of Signal Integrity Journal featuring articles from industry experts including:

• Eric Bogatin (SIJ Technical Editor)
• Larry Smith (PDNpowerintegrity.com)
• Steve Sandler (Picotest)
• Bert Simonovich (LAMSIM Enterprises Inc.)
• Mike Violette (Washington Laboratories and American Certification Body)
• HeeSoo Lee (Keysight Technologies)
• Nathan Hirsch (Monsoon Solutions Inc.)
• Orlando Bell (GigaTest Labs)
• Marko Marin (Infinera)
• Yuriy Shlepnev (Simberian Inc.)
• Antonio Ciccomancini Scogna (Huawei)
• Davi Correia (Carlisle Interconnect Technologies)

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PCB and Interconnect Design 
Sponsored by Sierra Circuits and Samtec

One of the fundamental problems with high-speed design in general and PCB/interconnect designs in particular, is that problems tend to be intermittent and hard to troubleshoot. So, as a PCB designer, how do you avoid the headaches of mysterious SI or PI issues on board? How do you select the best interconnects for the job to make them as transparent as possible to your design? 

Articles written by SI/PI experts to learn about some of the finer points of PCB Design for high-speed applications.

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Signal Integrity Journal Publishes First Print Issue
Register to download this debut print issue of Signal Integrity Journal featuring articles from industry experts including:

• Eric Bogatin (SIJ Technical Editor)
• Steve Sandler (Picotest)
• Al Neves (Wild River Technology)
• Bert Simonovich (Lamsim Enterprises)
• Istvan Novak (Oracle)
• John Coonrod (Rogers Corp)

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