EMI radiation and crosstalk caused by poor shielding can lead to signal quality and performance degradation in electronic RF devices. To minimize the overall EMI of electronic devices, local radiation sources on the integrated boards and modules must be well known.

VNAs make measurements in the frequency domain and can be used to supplant the information that native time domain instruments, like fast oscilloscopes, Signal Quality Analyzers (BERTs) and Time Domain Reflectometers/Transmission instruments (TDR/TDT’s) already provide.

Multi-tone testing has many benefits. While the multi-tone methodology was initially implemented to increase the speed of immunity testing, it has been found that this method also improves equipment efficiency, offers greater flexibility to truly test the equipment (EUT) under real world threat conditions, and can be fully compliant to standards.