This technical paper provides correlation studies between measured data and multiple field solver technologies, providing multiple references to different types of analyses that include AC frequency domain comparisons for both power integrity and signal integrity. It includes time domain characterization of the results using TDR and noise measurements for both packages and printed circuit boards. 

Compliance testing is essential to ensure that dynamic random access memory (DRAM) signals meet specifications in timing, slew rates and voltage levels. To quickly check signal qualities, eye diagram testing can provide insights into signal integrity conditions in a much shorter time.

VNAs make measurements in the frequency domain and can be used to supplant the information that native time domain instruments, like fast oscilloscopes, Signal Quality Analyzers (BERTs) and Time Domain Reflectometers/Transmission instruments (TDR/TDT’s) already provide.