When analyzing the robustness of data transmission systems, jitter is a key indicator. It is recommended to use jitter measurement instruments for both the time and frequency domain in order to differentiate between fast and slow moving artifacts.

VNAs make measurements in the frequency domain and can be used to supplant the information that native time domain instruments, like fast oscilloscopes, Signal Quality Analyzers (BERTs) and Time Domain Reflectometers/Transmission instruments (TDR/TDT’s) already provide.

This paper assesses how modern tools can be used to address poweraware SI challenges associated with I/O modeling, interconnect modeling, simulation, and analysis.