Rohde & Schwarz has many test instruments and solutions for highspeed digital design including oscilloscopes, spectrum and phase noise analyzers, signal generators, vector network analyzers, and power supplies.
This application note provides an introduction to the DDR memory technology and explains common challenges, related to the specific nature of DDR data, command / address and control buses and describes the typical measurements to verify and debug DDR system designs.
EMI radiation and crosstalk caused by poor shielding can lead to signal quality and performance degradation in electronic RF devices. To minimize the overall EMI of electronic devices, local radiation sources on the integrated boards and modules must be well known.
To investigate the stability of a switched-mode power supply, a Bode plot created with an oscilloscope is ideal for checking the critical phase margin and gain margin values. The factors that determine how satisfactory the results from Bode plot measurements will be, need to taken into consideration as part of the preparation.
When analyzing the robustness of data transmission systems, jitter is a key indicator. It is recommended to use jitter measurement instruments for both the time and frequency domain in order to differentiate between fast and slow moving artifacts.
Billions of crystals are manufactured annually to be used in virtually every electronic device. From mobile phones and fitness trackers to cars and cell towers, crystals are the heart beat of products we depend on daily. Crystals are the fundamental building block of electronic oscillator circuits that create an electrical signal with precise frequency. Learn more with Epson’s Designer’s Guide to: Common Considerations when selecting a MHz Crystal.