White Papers and App Notes

Gate Drive Measurement Considerations

The more successful a gate driver is in reducing power-up and power-down times, the bigger the headache for accurate measurements. Both choosing the right probe and optimizing the probing technique are significant factors in improving measurement accuracy. This white paper provides guidelines.


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DDR3 Data Eye Diagram Testing

Compliance testing is essential to ensure that dynamic random access memory (DRAM) signals meet specifications in timing, slew rates and voltage levels. To quickly check signal qualities, eye diagram testing can provide insights into signal integrity conditions in a much shorter time.


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