John Baprawski

John Baprawski is the Principal Engineer at ( focused on modeling high speed digital (HSD) integrated circuits (ICs) based on the industry Input/Output Buffer Information Specification (IBIS) Algorithmic Model Interface (AMI) standard. He is the principal engineer and architect for the website, channel simulation, modeling tools and technology. For the past 10 years, he has provided custom NRZ/PAM4 Tx/Rx IBIS-AMI models and modeling training for over 40 high speed digital IC semiconductor companies. Prior to this consulting work, John was the R&D manager at Keysight Technologies EEsof Division for 22 years responsible for initiating and evolving their system level design tools including ADS Ptolemy, Wireless Libraries and SystemVue products. He holds an MSEE degree from University of California, Los Angeles, and PhD studies in Optical Signal Processing at University of Michigan.


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Overcoming Signal Integrity Channel Modeling Issues

In this article, John Baprawski reviews various issues when using S-parameter files to represent the channel in a SerDes system channel simulator. Stepping through several detailed examples, he demonstrates how paying close attention to the quality of the S-parameters allows you to have confidence in the derived SerDes design eye diagrams and other analysis methods. 

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