Technical Articles

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Quick, Simple Way to Measure the System Bandwidth of a Scope-Probe System

While we get the scope’s bandwidth from the vendor, as soon as we add a cable, probe, or amplifier to the scope, we decrease the system bandwidth. The new system bandwidth is as important to know as the scope’s bandwidth, but it is generally difficult to measure except in a calibration lab. We offer a simple method of evaluating the transfer function and system bandwidth of any probing system using a wide band noise source. This method not only gives us information about the probes and interconnects, but it also tells us how the scope responds to the measurement system, information which cannot be measured by a VNA alone.


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Target Impedance Is Not Enough

Target impedance has become a standard tool when designing a power distribution network (PDN). It establishes a limit to the highest impedance the power rail on the die should see looking into the PDN. If the PDN impedance stays below this limit, even the worst-case transient current from the die will generate an acceptably low rail voltage noise.


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Preamplifier Options for Reducing Cable-Braid Loop Error

When measuring low impedance with the two-port shunt-through configuration, we potentially create an error due to the resistance of cable braids.  This error can be reduced or eliminated by using appropriate preamplifiers. There are professional preamplifiers on the market that do a great job reducing the cable braid error.  If you want to experiment with your own circuit, this article will help you


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16Gb/s and Beyond with Single-Ended I/O in High-Performance Graphics Memory

The paper discusses the development of GDDR6 as a lower-risk and more cost-effective solution as compared to other high-bandwidth memory solutions.


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A Study of Forward Error Correction Codes for SAS Channels

This paper evaluates the performance of several choices of Reed-Solomon code and shows how a frame-interleaved RS(30,26) code can achieve 1e-15 bit-error rate (BER) in the presence of burst errors. See the authors conclude that, as data rates go higher, current 128b/130b encoding is not a good option as the two-bit 01/10 overhead suffers due to its Nyquist pattern property.


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VRM Modeling: A Strategy to Survive the Collision of Three Worlds

This paper reviews four levels of VRM models that VRM designers, board level interconnect designers, semiconductor designers, and product managers often use to explore design tradeoffs throughout the PDN system. The choice of which one to use involves considering engineers’ levels of expertise and what problems they expect to analyze. Some tradeoffs and relative merits of the models are described.


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Outer Loop Equalization for PCIe Cross-Lane Transceiver Optimization

PCIe Gen4 Standards Margin-Assisted Outer-Layer Equalization for Cross-Lane Optimization in a 16GT/s PCIe Link

PCIe Gen4 enables new wave of innovation to guide inner-loop SerDes optimization assisted by outer-loop system optimization. This paper introduces an outer-layer equalization scheme for managing SerDes inner-layer equalization to optimize overall system-level aggregate performance.


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40 GHz PCB Interconnect Validation: Expectations vs Reality

What does it take to design PCB interconnects with good analysis-to-measurement correlation up to 40 GHz? Is it doable with typical low-cost PCB materials and fabrication process, typical trace width, via back-drilling and the shortage of space to place the stitching vias? This paper reports lessons learned from validation projects with the goal to build a formal procedure for systematic prediction of interconnect behavior up to 40 GHz. Topics include: selection of test structures, connectors and measurement equipment, and analysis uncertainties.

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A Causal Conductor Roughness Model and its Effect on Transmission Line Characteristics

In the GB/s regime, accurate modeling of insertion loss and phase delay is a precursor to successful high-speed serial link designs. We propose a causal (physically meaningful) form of the Hammerstad and Cannonball-Huray metal roughness frequency dependent complex correction factor. Compared to the widely used, non-causal form, it considerably increases the inductive component of internal metal impedance. Transmission lines simulated with a causal version demonstrate increased phase delay and characteristic impedance. By obtaining the dielectric and roughness parameters solely from manufacturers' data sheets, we validate the model through a detailed case study to test its accuracy.


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