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With the recent introduction of the Averatek Semi-Additive Process (A-SAP) process, linewidths under 1 mil are possible using the same fabrication processing line as for traditional 4 mil wide lines. This opens up the possibility of using narrower traces in the BGA escape region than in long-path routing regions. However, using this routing architecture means the narrower traces in the BGA escape field are at a higher impedance than the wider, 50 ohm traces in the routing region. So, how long can these traces be before the impedance mismatch is a problem? The authors of this piece propose an analysis methodology to find out.

Impedance is the most fundamental and important electrical property of any component. With a very simple technique, anyone can simulate the impedance of any circuit in seconds using any version of SPICE, for free. Read on to learn more.

Kandou announced volume production of its Matterhorn™ family of USB-C® multiprotocol retimer solutions with USB4™ support.

As rated by reader views, here are the Top 5, Most Read Blogs on SIJ of all time. Thank you for your continued readership, as we look forward to bringing you many more great features in 2022 and beyond!

As rated by reader views, here are the Top 5, Most Read Articles on SIJ of all time. Thank you for your continued readership, as we look forward to bringing you many more great technical features in 2022 and beyond!

As rated by attendance, here are the Top 5 Webinars on SIJ of all time. These presentations are available to watch on demand at your leisure. Thank you for continuing to join us, as we look forward to bringing you many more educational and informative presentations in 2022 and beyond!

Now that I am teaching full time and have a number of undergraduate and graduate students doing weekly project reviews, I listen to more presentations than I give. I find myself giving the same feedback over and over again. So, I thought I would share my eight most common comments and tips to engineers giving presentations.

This first post in a new blog series, Extreme Measurements, introduces how an extreme measurement is defined. Find out how your extreme measurement story can end up on SIJ!

“Over the years I’ve come to realize that, particularly in signal integrity, half-wave resonances are often the cause of ugly S-parameters. You can argue that any type of resonance would cause problems, and you would be right. However, half-wave resonances are easily formed in topologies.” This article summarizes observations from Gustavo Blando on the formation and mitigation of half-wave resonances, and includes an in-depth study on the topic in PDF format from the author.

SIJ editorial advisory board member Yuriy Shlepnev offers a comparison of three ways to visualize the same s-parameter data, identifying how to get the most information from a plot.