Featured Stories

Thumbnail

Characterizing and Selecting the VRM

VRMs and VRM controllers are often selected based on size, efficiency, price, or a relationship with the manufacturer. This often leads to a poor VRM selection, requiring additional engineering resources, greater time to market, as well as, higher BOM costs to correct the deficiencies. In this article, we evaluate the choices, define some useful figures of merit, and provide specific selection suggestions.


Read More
edi con china 2018 entrance

Back to Beijing - EDI CON China 2018 Event Review

After last year’s EDI CON China event taking place in Shanghai, EDI CON China returned to Beijing at the Chinese National Convention Center directly across from the Olympic Park. Close to 3,000 unique attendees participated in the conference with more than 125 companies in the exhibition. Read this complete review of the event.


Read More
thumb

Validating IBIS Models with Measurements

At the University of Colorado, Eric Bogatin and students Thomas Rutkowski and Huy Nguyen look for a way to validate IBIS models, bringing measured data from a scope into a simulation environment. This article includes an explanation of how the team compared predicted results of the IBIS model supplied by the vendor, the results from a generic model, and measured results from a randomly selected part.


Read More
EDI CON China 2018 awards thumb

EDI CON China 2018 Announces Winners In Innovation Awards

Winners announced in test & measurement, software/EDA, semiconductors, components, and materials.

Last night, at EDI CON China 2018, the conference and exhibition that brings together engineers working on high-frequency analog and high-speed digital designs, the winners were announced in the EDI CON Innovation Awards. This award program honors products that have had the greatest impact on the industry this year, providing the tools necessary to bring on the next generation of electronic design innovations.


Read More
thumb

Target Impedance Limitations and Rogue Wave Assessments on PDN Performance

A common design technique for power distribution networks (PDN) is the determination of the peak distribution bus impedance that will assure that the voltage excursions on the power rail will be maintained within allowable limits, generally referred to as the target impedance. In theory, the allowable target impedance is determined by dividing the tolerable voltage excursion by the maximum change in load current.


Read More
figure15_thumb

Transient Load Tester for Time Domain PDN Validation

Power distribution networks (PDNs) delivering power to ICs in a system need to be thoroughly designed and analyzed in order to make sure any voltage fluctuation on the rail is within the tolerance of every IC connected to that rail.  As ICs on the rail draw power, they generate a voltage fluctuation on the rail.  The PDN must have the capacity to supply enough charge such that the resulting voltage drop is less than the maximum voltage drop each IC on the rail can tolerate.  If voltage fluctuations appear outside IC tolerance limits, a slew of problems can surface such as IC damage, failure, or reduced lifespan.


Read More