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Heidi Barnes is a Senior Application Engineer for High Speed Digital applications in the EEsof EDA Group of Keysight Technologies. Her recent activities include the application of electromagnetic, transient, and channel simulators to solve the challenges of high speed SERDES and parallel bus communication links. Past experience includes 6 years in signal integrity for ATE test fixtures for Verigy, an Advantest Group, 6 years in RF/Microwave microcircuit packaging for Agilent Technologies, and 10 years with NASA in the aerospace industry. Heidi graduated from the California Institute of Technology in 1986 with a bachelor’s degree in electrical engineering. She has been with Keysight EEsof since 2012.
The fixtures used to characterize interconnects in complex systems can have a significant effect on the measured data, read on to get the background and perspective on IEEE P370. Check out this Outstanding Paper Award Winner from EDI CON USA 2018.
Here's a proposed method that improves the accuracy of DDR4 statistical simulation by using the mask correction factor. It presents a validated correlation between measured and simulated data to show that this methodology can be effectively used for DDR4 design
