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Top 10 Articles for 2018

As rated by reader views, here are the Top 10 Articles on Signal Integrity Journal for 2018. Thank you for your readership in 2018, and we look forward to bringing you many more great technical features in 2019!


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A Study of Forward Error Correction Codes for SAS Channels

This paper evaluates the performance of several choices of Reed-Solomon code and shows how a frame-interleaved RS(30,26) code can achieve 1e-15 bit-error rate (BER) in the presence of burst errors. See the authors conclude that, as data rates go higher, current 128b/130b encoding is not a good option as the two-bit 01/10 overhead suffers due to its Nyquist pattern property.


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VRM Modeling: A Strategy to Survive the Collision of Three Worlds

This paper reviews four levels of VRM models that VRM designers, board level interconnect designers, semiconductor designers, and product managers often use to explore design tradeoffs throughout the PDN system. The choice of which one to use involves considering engineers’ levels of expertise and what problems they expect to analyze. Some tradeoffs and relative merits of the models are described.


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Outer Loop Equalization for PCIe Cross-Lane Transceiver Optimization

PCIe Gen4 Standards Margin-Assisted Outer-Layer Equalization for Cross-Lane Optimization in a 16GT/s PCIe Link

PCIe Gen4 enables new wave of innovation to guide inner-loop SerDes optimization assisted by outer-loop system optimization. This paper introduces an outer-layer equalization scheme for managing SerDes inner-layer equalization to optimize overall system-level aggregate performance.


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40 GHz PCB Interconnect Validation: Expectations vs Reality

What does it take to design PCB interconnects with good analysis-to-measurement correlation up to 40 GHz? Is it doable with typical low-cost PCB materials and fabrication process, typical trace width, via back-drilling and the shortage of space to place the stitching vias? This paper reports lessons learned from validation projects with the goal to build a formal procedure for systematic prediction of interconnect behavior up to 40 GHz. Topics include: selection of test structures, connectors and measurement equipment, and analysis uncertainties.

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