Voice of the Experts: Signal Integrity
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The articles and columns contained in this section come from members of the Signal Integrity Journal’s Editorial Advisory Board (EAB) and acknowledged experts in the SI field. These authors are often sought after for their advice. In this column area, the EAB and other SI experts will talk about issues related to signal integrity.

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Validation of Bend Models with Measurements

Bends in PCB traces look like very basic, simple structures that are easy to simulate. Technically, one can do the analysis with any electromagnetic solver with sufficiently accurate port de-embedding capabilities. The reflections from a bend in fine-line, high-speed digital interconnects are relatively small and may not even be detectable with measurement. So, who cares? Read on to find out more.


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112 G for Quickest Data Transfer

Data usage is increasing every year, and the communications industry is working diligently to support the increased demand. This article discusses why we need more data, what data center physical layer architecture changes are needed to support higher data rates, and how connector manufacturers are improving designs to support higher data rate systems.


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112 Gbps PAM4 Silicon and Connector Evaluation Platform

The continued progression to higher data rates puts increasing demands on the design of practical SerDes channels. At 112G-PAM4, the UI is only 17.86 ps, and signal transmission in the PCB must be highly optimized for loss, reflections, crosstalk, and power integrity. This article summarizes the key elements of a study that describes the signal-integrity and power-integrity design process and shows simulated SI and PI performance correlated to measured data as well as measured eye diagrams of a test board that uses a 112G-capable silicon and high-speed compression-mount cable connectors. 


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