Voice of the Experts: Signal Integrity
Voice of the Experts: Signal Integrity RSS FeedRSS

The articles and columns contained in this section come from members of the Signal Integrity Journal’s Editorial Advisory Board (EAB) and acknowledged experts in the SI field. These authors are often sought after for their advice. In this column area, the EAB and other SI experts will talk about issues related to signal integrity.

Stub image

Via Stubs – Are They all Bad?

We worry about via stubs in high-speed designs because they cause unwanted resonant frequency nulls which appear in the insertion loss plot (IL) of the channel. But are all via stubs bad? Well, as with most answers relating to signal integrity, “It depends.”


Read More