Brandon T. Gore

Brandon T. Gore is presently a Principal Technologist at Samtec managing both the Signal Integrity R&D and Electronic Industry Standards teams. His research focuses are advanced interconnect materials, glass packaging, direct drive optics, and general signal integrity bottlenecks for 200 Gbps data rates. He is an active contributor to both IEEE 802.3 and OIF Common Electrical I/O projects at 112 Gbps and 224 Gbps. Brandon received the PhD degree in electrical engineering from the University of South Carolina under Dr. Paul G. Huray.

ARTICLES

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Path to 400G May Require Alternative Architectures

DesignCon 2025 Best Paper Award Winner

Traditional data-center physical layer architectures have undergone a significant transition due to the growth of east-west traffic within the data center for AI/ML cluster applications. This data growth has driven enormous demand for throughput in both chip-to-chip and chip-to-module channels. In this paper, which was awarded Best Paper Award at DesignCon 2025, the authors explore various physical layer design improvements through simulation and modeling tools.



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Are 1.0 mm Precision RF Connectors Required for 224 Gbps PAM4 Verification?

DesignCon 2024 Best Paper Award Winner

This paper, awarded the Best Paper Award at DesignCon 2024, explores what is meant by bandwidth during the standardization process, the implications of test and verification attached to certain bandwidth requirements, as well as differences between acquisition range, band limited filters, and s-parameters for time domain processing. 


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Next-Generation PCB Loss Analysis

In preparation for 224 Gb/s and beyond, Samtec engaged in a research project to characterize the transmission performance of emerging PCB material sets. Brandon Gore explores the current state of the art for PCBs and cables, comparing them and assessing the technology gap to fully support the insertion loss performance required for higher data rates.


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