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By treating the resistor as an electromagnetic structure rather than a lumped element, and by managing coupling, shielding, thermal paths, and compensation as part of a unified design, it becomes possible to achieve ultra‑low insertion inductance and gigahertz‑class measurement bandwidth in a device small enough for production use. The result is a measurement element that enhances system performance rather than limiting it. As power systems continue to push toward higher speed, higher density, and higher reliability, the current‑sense resistor must evolve accordingly. In this article, Steve Sandler outlines a path to that evolution.

Signal Integrity Journal, covering signal integrity, power integrity and EMC/EMI, has published its April 2026 issue. Don't miss out on the latest. Download now!

By leveraging radiation-hardened GaN HEMTs and a compact, high-efficiency design, EPC Space not only met the stringent demands of size, weight, reliability, and performance, but exceeded them, delivering modules that have proven their worth in the harsh environment of space. Read on to learn more about how this success underscores the potential of GaN-based solutions to drive the next generation of satellite systems, paving the way for more affordable, sustainable, and resilient space exploration.

As currents increase and voltage rails shrink, managing fluctuations becomes a critical challenge. While probe noise is a major factor, the common-mode noise induced by the ground loop between the high-current DUT and the oscilloscope is often the more dominant disruptor in high-current AI environments. This experiment proves that simply switching oscilloscope vendors will not solve the problem. Read on to learn why the solution lies in the probing chain.

This article describes the use of Cadence’s Sigrity signal and power integrity solution ML optimization algorithm to quickly and efficiently converge on the best set of parameters in a set of IBIS-AMI models. The application of Sigrity was investigated for refining IBIS- AMI parameters to find the optimal set of values to maximize a specific metric.