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At the recent 2016 IEEE EMC Symposium in Ottawa, I had the opportunity to talk with two of the worlds’ experts on high frequency electrical characterization of interconnects and gained new insight on best practices for connector modeling and measuring.

In many measurements, connections to the Device Under Test (DUT) is very important and can fundamentally determine whether the data we get is correct or not, whether the result is useful or potentially misleading.  This article highlights some of the main items to consider.  To illustrate the points, we use examples with DC-DC converter evaluation boards.

In this paper, we introduce a special class of resonant structure - the Beatty Standard - along with other classic resonators. We examine closely the resonant Beatty Standard, its impedance profile, loss characteristics, and its application to printed circuit board material property extraction. Suited for 32 Gbpsec simulation requirements, the Beatty Standard not only provides engineers a compact structure to perform material property extraction, but also help with establishing a robust design flow.