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Steve Sandler of Pico Test and Heidi Barnes of Keysight teach this short course on Power Integrity at EDI CON USA 2016 - Part I is about 90 minutes and Part II about 30 min. Site registration is required to view this course.

You would think that interconnect design for rf applications and high-speed digital applications would be very similar. After all, the upper frequency range of the applications are similar. Here area few examples of how rf engineering is different from high speed digital engineering.

One of the most common measuring tasks in RF and SI engineering involves analysis of circuits (networks). A network analyzer is an instrument that is designed to handle this job with great precision and efficiency. Circuits that can be analyzed using network analyzers range from simple devices such as filters and amplifiers to complex modules used in communications satellites.

For years, when discussing high field-strength electromagnetic compatibility (EMC) radiated susceptibility testing, Traveling Wave Tube Amplifier (TWTA) technology has been the only available option for pulsed field generation. Now, there is a very attractive alternative to this technology.

Saelig Company, Inc. announces the availability of PicoConnect™ 900 Series Microwave/Gigabit Passive Test Probes, providing cost-effective testing of broadband signals or data streams up to 9GHz or 18Gb/s, including USB 2 & 3, HDMI 1 & 2, Ethernet, PCIe, SATA and LVDS standards. Representing a price-performance breakthrough, these new high-performance test probes have less than 0.4pF tip capacitance and a ground-referred loading of 220 to 910 ohms. 

If you missed the chance to attend the first EDI CON (Electronic Design Innovation Conference) in Boston last Aug, you missed the first conference to bring together industry participants across the spectrum of rf, microwave, wireless and high speed digital applications of signal integrity, power integrity and EMI. Rarely are these divergent, yet related fields addressed under one roof.

Analog Devices, Inc. (ADI) today introduced a highly integrated polyphase analog front end (AFE) with power quality analysis designed to help extend the health and life of industrial equipment while saving developers significant time and cost over custom solutions. Achieving extremely accurate, high-performance power quality monitoring typically requires customized development, which can be expensive and time-consuming.

Differential clock and timing devices are commonly characterized for phase noise using baluns. While deceptively simple to use, baluns perform a fairly complicated process that can unknowingly introduce artifacts into measured results. This article describes such artifacts, discusses why they appear and how to eliminate them. Recommendations are provided for selecting a balun and using it to accurately characterize devices for phase noise.