Designers pushing the limits in their application can run into situations where the XO performance is inadequate for their next design due to the way it reacts to the noise and ripple in the power supply. To achieve optimal performance, they most likely will find they will need to do more than a simple datasheet evaluation to select their next XO. Read on for details on a PSNR test method to help select an optimal XO.
Since an oscilloscope and phase noise analyzer observe jitter differently, obtaining the same value from both instruments can be challenging. This article presents a phase-noise based methodology that provides similar values as time-interval error jitter derived from an oscilloscope.
Here’s a look at how phase noise converts to time-interval error jitter, which is particularly important to those working on reference clocks for high-speed SERDES or sampling clocks. Read on to see how this can help debug systems to reduce sources of timing noise.
This article examines the key noise processes involved in measurements of jitter and phase noise, shows how these processes impact test results for various types of test equipment, and provides insight for interpreting these results.