This application note provides an introduction to the DDR memory technology and explains common challenges, related to the specific nature of DDR data, command / address and control buses and describes the typical measurements to verify and debug DDR system designs.
EMI radiation and crosstalk caused by poor shielding can lead to signal quality and performance degradation in electronic RF devices. To minimize the overall EMI of electronic devices, local radiation sources on the integrated boards and modules must be well known.
To investigate the stability of a switched-mode power supply, a Bode plot created with an oscilloscope is ideal for checking the critical phase margin and gain margin values. The factors that determine how satisfactory the results from Bode plot measurements will be, need to taken into consideration as part of the preparation.