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How do you achieve high bandwidth in your measurements while minimizing current load on your DUT? Given that your DUT is a power rail, you really don't want to draw too much current from it., or your measurement system will distort the rail. But these two measurement criteria are at loggerheads with each other. It's a quandary, and it has to do with the fundamental nature of signals on interconnects.
Picotest has released the PerfectPulse signal generator, designed to be a low cost, pocket-sized, fast edge signal generator and TDR in one package. Picotest reports that this type of high-speedTDR/TDT has never been available in this portable form, requiring only a USB power source, and at this price point.
Pasternack has launched a new line of skew matched cables for use in high-speed digital tests of 10 Gbps to 28 Gbps, including differential signals, bit-error-rate testing and eye diagrams. Pasternack’s new line of skew matched cables is made-up of three new models that are extremely flexible and have 1 ps delay match. These cables deliver excellent VSWR of 1.4:1 and are 100% tested for skew match.
By Rohde & Schwarz
This white paper looks at a CISPR 16-1-1-compliant test instrument with time domain scanning capabilities. The paper compares the measurement speed and level measurement accuracy of a conventional stepped frequency scan versus an advanced FFT-based time domain scan. It also contains guidance on making optimum use of time domain scans.
This presentation introduces CST STUDIO SUITE Rule Check®: A smart design rule checking platform that includes knowledge of signal parameters such as rise/fall times, voltage swing, and data rate. Learn how CST STUDIO SUITE Rule Check takes rule checking to the next level.
IoT applications with an embedded controller, sensors, actuators and a wireless interface are proliferating in many applications. Most of these designs are cost driven, low power driven and with a specific form factor. We'll introduce the seven most important design guidelines useful for all IoT boards which reduce the chance of SI/PI and EMI problems.
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