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The more successful a gate driver is in reducing power-up and power-down times, the bigger the headache for accurate measurements. Both choosing the right probe and optimizing the probing technique are significant factors in improving measurement accuracy. This white paper provides guidelines.

Today, R&D engineers face challenging time-to-market goals. In addtion a significant number of products in the development cycle fail EMC compliance the first time. Download our material and get new insights in EMI debugging.

The R&S®RTO / R&S®RTE digital oscilloscope is a valuable tool for analyzing EMI problems in electronic designs. High input sensitivity, high dynamic range and a powerful FFT implementation are key features for capturing and analyzing unwanted emissions. Learn more in our paper.

EMI compliance is becoming a major concern for advanced power electronics due to increasing switching speeds. Correlated time-frequency measurements help optimize gate driving and minimize electromagnetic emission already during development.

Compliance testing is essential to ensure that dynamic random access memory (DRAM) signals meet specifications in timing, slew rates and voltage levels. To quickly check signal qualities, eye diagram testing can provide insights into signal integrity conditions in a much shorter time.

Data center operators must embrace next-generation technologies to support the response times and bandwidth requirements of 5G and IoT. 400GE requires faster memory and faster serial bus communications.

When analyzing the signal integrity performance of DDR interfaces, separating read and write cycles has been a challenging task. Comprehensive trigger capabilities are required – especially when attempting to recreate the eye diagram in realtime.