December 12, 2017

Sponsored by: EDI CON CHINA


SI Methodology

Signal Integrity Methodology for Double-Digit Multi-Gigabit Interfaces

By Ken Willis

This paper suggests methodologies for creating a “virtual prototype” of a serial link pre-design and how to create the associated interconnect and SerDes models that go with it.


Maxim Transceivers Provide 2x Faster Data Rates and Up to 50% Extended Cable Length for Motion Control and Industrial Applications

The MAX22500E, MAX22501E, and MAX22502E RS-485 transceivers extend the reach of communication up to 100Mbps over 50m, achieving the industry’s fastest data rates for communication across long cables for a variety of motion control applications.


New 5 Series MSO Low-Profile Oscilloscope Raises Bar for Machine Diagnostics, High Energy Physics Test

Tektronix, Inc., a worldwide provider of measurement solutions, announced the 5 Series MSO Low Profile oscilloscope for machine diagnostics and automated test (ATE) applications.



Rohde & Schwarz

In Situ Calibration Utilizing the R&S®ZN-Z3x Inline Calibration Units

By Rohde & Schwarz

This application note reviews a new calibration subsystem which consists of Inline Calibration Units (ICUs). These ICUs are designed for in situ use, so they are left in place both during the calibration procedure and during the measurement of the Device Under Test (DUT).


SIJ Publish Your Work

Publish Your Work On Signal Integrity Journal


Signal Integrity Journal publishes educational, high-value content on topics related to signal integrity, power integrity, and EMC/EMI. Consider targeting your recent work in these areas. Share your work with the engineers who are really interested and will ask questions. Take this opportunity to engage your peers and add your voice to the SIJ conversation.

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Advertising Opportunities


Signal Integrity Journal has announced its new customizable sponsorship packages, advertising opportunities, and editorial calendar for 2018. Check out how you can directly reach your audience of SI, PI, and EMC/EMI engineers with the Signal Integrity Journal.


Upcoming Webinars

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In-Situ De-embedding

Traditional de-embedding methods can give non-causal errors in device-under-test (DUT) results if the test fixture and calibration structure have different impedances. This presentation introduces In-Situ De-embedding (ISD) to address such impedance differences using software instead of hardware, thereby improving de-embedding accuracy while reducing hardware costs.

PCI Express Gen3, Gen4 and Gen5 Physical Layer Test Requirements and Procedures

This webinar will equip engineers with an understanding of the test specifications, detailed test procedures, and optimal test equipment configurations to ensure their products pass PCI Express compliance testing.


Keysight Engineering Education

Join Keysight experts for complimentary 60-minute webcasts on a variety of RF and digital measurement applications. Learn more and register for these events.

Visit our archived webinars page for educational resources on various design and measurement subjects and view at your convenience.
Browse webinars here.

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