Signal Integrity Webinar Series
Title: In-Situ De-embedding
Date: December 12, 2017
Time: 8am PT/ 11am ET
Presented by: Ching-Chao Huang, President - AtaiTec Corporation
Sponsored by: Rohde & Schwarz USA
Traditional de-embedding methods can give non-causal errors in device-under-test (DUT) results if the test fixture and calibration structure have different impedances. This presentation introduces In-Situ De-embedding (ISD) to address such impedance differences using software instead of hardware, thereby improving de-embedding accuracy while reducing hardware costs. The following topics will be discussed with up to 50+ GHz measurement examples:
Ching-Chao Huang, founder and president of AtaiTec Corporation, has more than 30 years of high-speed design and SI software development experience. He was advisory engineer at IBM, R&D manager at TMA, SI manager at Rambus, and Sr. VP at Optimal. Dr. Huang is an IEEE senior member and he pioneered In-Situ De-embedding (ISD) for causal and accurate de-embedding. He received his BSEE from National Taiwan University and MSEE and PhD from Ohio State University.