November 28, 2017

Sponsored by: EDI CON CHINA

Cost-Effective PCB Material Characterization for High-Volume Production Monitoring

By YongJin Choi, Christopher Cheng, Yasin Damgaci, Nagaraj Godishala, and Yuriy Shlepnev

Get the details on a space-efficient method that is accurate up to medium/high frequency with high testing throughput while being cost effective (and using almost all existing testing infrastructures) in a high-volume PCB manufacturing environment.

Knowles Capacitors launch 500Vac rated Surge & Safety MLCCs from Syfer

Developed at the specific request of industrial electronics customers, Knowles brand Syfer can now offer MLCC’s, for non-safety critical applications, up to 500Vac, 50/60Hz continuous. Syfer pioneered 250Vac rated MLCC’s for non-safety critical applications to complement its range of industry standard DC rated and market leading TUV / UL qualified class X & Y surge and safety MLCCs.

Pico extends its PicoScope 9300 Sampling Oscilloscope range

Pico Technology added three 15 GHz models and a further 25 GHz model to its professional, portable and low-cost PicoScope 9300 Series of Sampling Oscilloscopes. The new 15 GHz models replace the preceding 9200 Series 12 GHz models, with significantly upgraded specifications at even lower prices, with the result that all Pico Sampling Oscilloscopes now operate under the much-respected PicoSample 3 software.

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Using VNAs as a Tool for Signal Integrity in High Speed Digital Systems

By Anritsu

This paper will explore how bit rates in serial communication systems increase the signal paths and why they must be treated as high frequency transmission lines.

SI/PI/EMI Consultants

Sometimes you need an assist with an SI, PI, or EMI issue. If you need help, check out this list of consultants working in signal integrity, power integrity, and EMC/EMI listed in our resources section.

Upcoming Webinars

The 3 Necessary Evils - Discover and Solve PI, SI and EMI Issues Affecting Designs

Today a lot of electronic designs are faced with multiple challenges while integrating digital, analog and RF circuits. To achieve compliance and relevant performance, designers need to characterize power lines and tracks, high speed comms and verify their integrity while not causing any bigger EMI issues. Learn about the relevance of power integrity, signal integrity, and EMC.

In-Situ De-embedding

Traditional de-embedding methods can give non-causal errors in device-under-test (DUT) results if the test fixture and calibration structure have different impedances. This presentation introduces In-Situ De-embedding (ISD) to address such impedance differences using software instead of hardware, thereby improving de-embedding accuracy while reducing hardware costs.

PCI Express Gen3, Gen4 and Gen5 Physical Layer Test Requirements and Procedures

This webinar will equip engineers with an understanding of the test specifications, detailed test procedures, and optimal test equipment configurations to ensure their products pass PCI Express compliance testing.

Visit our archived webinars page for educational resources on various design and measurement subjects and view at your convenience.
Browse webinars here.