October 9, 2018

Sponsored by: Noisecom



Statistical-Based RE DCD Jitter Analysis in High-Speed NAND Flash Memory

By Sayed Mobin and Cindy Cui

There are very few studies found in the industry focusing on the duty cycle distortion (DCD) jitter impact the NAND Flash memory system, especially at higher performance and higher load count. This paper focuses on the importance of DCD jitter analysis at higher speed and heavier loading NAND systems, and introduces a statistical approach to DCD jitter analysis.

Teledyne LeCroy

Teledyne LeCroy Launches Teledyne Test Tools (T3) Branded Portfolio with Two True-Differential TDRs

Teledyne LeCroy announced the launch of Teledyne Test Tools (T3), a portfolio that adds a comprehensive range of test equipment to the Teledyne LeCroy product offering. The T3 brand establishes a platform for test engineers, developers, and schools. Discover more.

Rohde & Schwarz  

Rohde & Schwarz Introduces the All-new R&S FSW with Enhanced Analysis Bandwidth and RF Performance

Rohde & Schwarz FSW models with a maximum input frequency of 26.5 GHz and above are now available with a 2 GHz internal analysis bandwidth option and an 800 MHz bandwidth option for real-time analysis. Users will have access to a new operating concept and an SCPI recorder for remote controlled test sequences.




Xilinx + Samtec 56 Gbps PAM4 Backplane Demonstration

By Samtec

This is a live demonstration of a combined Xilinx-Samtec 56 Gbps PAM 4 backplane system. The results achieved from this combined Xilinx/Samtec set-up proves the viability of 56G PAM4 signals in next-gen backplane applications found in data center equipment.


Last Chance to Pre-Register for EDI CON USA

This year, the event takes place October 17-18 at the Santa Clara Convention Center. The conference will feature Eric Bogatin’s High Speed Digital Symposium, EDI CON University tutorials, panels, technical sessions, and workshops with hands-on techniques covering SI, PI, EMC/EMI, as well as RF and microwave topics. The exhibition floor will be open both days, complete with exhibitors and demonstrations and panels in the Frequency Matters Theater on the show floor. Join us for learning, networking, keynotes, and the opportunity to see the latest products in SI, PI, EMC/EMI, RF, and microwave. Get 30% off conference pass admission with the code: #EDICON18 or a free EXPO pass.

Upcoming Webinars

Keysight Webcast

Keysight Webcast, A Practical Guide to Signal Integrity: Basic Analyses and Concepts

This webinar will analyze a typical high-speed channel with several different approaches: mixed-mode S-parameters, eye diagram metrics, time domain reflectometry (TDR) and single pulse response. For an engineer new to designing serial links such as PCI Express, it is essential to recognize that the signal can contain spectral content to tens of gigahertz. Learn more and register.



Visit our archived webinars page for educational resources on various design and measurement subjects and view at your convenience.
Browse webinars here.

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