Items Tagged with 'return loss'

When designing circuit boards, a change made to one aspect of the design intended to resolve an issue can cause problems elsewhere. To reduce the problem of soldering on SMA connectors in an edge launch, a significant signal integrity problem has been introduced. This article explores best practices and provides insight into avoiding an inadvertent mistake.

Eric Bogatin shares four useful tools that illustrate the dynamic nature of propagating signals, promoting the understanding that is imperative to the design of high-performance products.

In this article covering next-generation USB technology, Keysight reviews IP/PHY development kits, simulation solutions, and T&M solutions that serve as the foundation for silicon and system integrators to design compliant USB4 Version 2.0 products that meet strict interoperability requirements in the vast Type-C ecosystem.