Pat Hindle, SIJ Contributing Editor
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Pat Hindle

Pat Hindle is responsible for editorial content, article review and special industry reporting for Signal Integrity Journal and Microwave Journal magazines plus their web sites. He also leads social media and special digital projects. Prior to joining the Journals, Mr. Hindle held various technical and marketing positions throughout New England, including Marketing Communications Manager at M/A-COM (Tyco Electronics), Product/QA Manager at Alpha Industries (Skyworks), Program Manager at Raytheon and Project Manager/Quality Engineer at MIT's Space Nanostructures Laboratory. Mr. Hindle graduated from Northeastern University - Graduate School of Business Administration and holds a BS degree from Cornell University in Materials Science Engineering.


Ansys Releases Software Into Open Source

PyAnsys, a family of Python packages is now available

It may have gone somewhat unnoticed but for the first time ever, Ansys released software into the open source late last year. The software is PyAnsys, a family of Python packages providing a new, unified programmable interface to the company’s proprietary simulation stack. Learn more about this development.

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Imec Develops Method for Co-Integration of GaN Half-Bridge With Drivers to Boost Performance

At PCIM 2019 last month, imec announced a functional GaN half-bridge monolithically integrated with drivers. The release described how mounted on a buck-convertor test board, the chip converts an input voltage of 48 V to an output voltage of 1 V, with a pulse width modulation signal of 1 MHz. The achievement leverages on imec’s GaN-on-SOI and GaN-on-QST® technology platforms, reducing parasitic inductance and boosting commutation speed.

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Test System Addresses Demands of 56/112G PAM4 Using Upcoming IEEE P370 Standard

eSilicon was in the Samtec booth at DesignCon 2019 presenting their collaboration with Wild River Technology to develop an advanced test system that addresses the difficult signal integrity demands of 56/112G PAM4 operation. The test system design utilizes the upcoming IEEE P370 standard in association with compliance metrics 802.3bs, OIF CEI – 56G PAM4, and COBO to validate the required performance.

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Measurement Instruments for the Many

Rohde & Schwarz has always been known for high end, very accurate instruments in the high frequency but did you know that R&S has a portfolio of value class instruments with more than 100 products and 300 accessories? From their recent release, here is a summary of the new value instrument additions they highlighted.

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Top 10 Articles for 2017

As rated by reader views, here are the Top 10 Articles on Signal Integrity Journal for 2017. Thank you for your readership in 2017, and we look forward to bringing you many more great technical features in 2018!

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EMC Engr Book

Book Review - A Practical Guide to EMC Engineering

Levent Sevgi, who has worked with electromagnetics for almost three decades, wrote this book to address the breadth of EMC engineering topics that are not covered by more specialized texts: market control, accreditation, calibration, EMC testing and measurement and mitigation.

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Engineer What’s Next – NIWeek 2017

This is the first year that NIWeek has taken place in late May instead of its normal early August time slot and switches permanently to this part of the calendar. NIWeek 2017 kicked off with new CEO Alex Davern paying tribute to Dr. T with a standing ovation from the audience. Read this summary of what happened at NIWeek 2017.

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