Hiroshi Goto

Hiroshi Goto has over 25 years of experience as a high-speed and optical engineer at Anritsu Company. He has held a variety of positions, including design engineer, product marketing engineer and currently is High-speed and Optical Product Manager and Business Development Manager.

ARTICLES

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High-Speed Digital Interface Characterization Requires New Test Approach

The increasing speeds of digital interfaces to meet the ever-growing data demands of modern society places stress on design engineers. A new test methodology for measuring intra-pair skew is necessary to verify high-speed interfaces such as PCI Express. The BERT-based setup uses a new method with dual transmitters to control the phase of signals within a differential pair, enabling granular measurement of intra-pair skew. This capability is crucial for understanding and mitigating the impact of skew on BER margins at high data rates such as 64 GT/s.


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