Alex Manukovsky

Intel Corporation

ARTICLES

Modeling PCB Interconnects with Geometry and Material Parameters Variations for 56 Gbps Links

Measured S-parameters and cross-sections of PCB interconnects are used in this paper to identify the parameters of electrical models suitable for statistical analysis of interconnects with manufacturing variations. The constructed models reproduce observed effects of geometry and material properties variations on the loss, delay, and impedance, and they are suitable for yield analysis of interconnects with up to 56 Gbps signals.


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