Anritsu Company (DesignCon booth #837) will provide design engineers with a portfolio of signal integrity solutions at DesignCon 2020, held January 28-30 in Santa Clara, CA. Leading test instruments and emerging techniques to verify designs featuring PCI Express® (PCIe®) 3.0/4.0/5.0, Ethernet PAM4, and other high-speed interconnect technologies will be on display to help engineers gain confidence in the chipsets, cables, interconnects and systems being developed.

Headlining the test demonstrations in the Anritsu DesignCon booth will be a PCI Express test solution that supports the PCIe 5.0 Base/CEM Specification Stressed Receiver Test. At the center of the demonstration will be the Signal Quality Analyzer-R MP1900A Series with installed Automation Software for base specification calibration and BER Measurement Software supporting the SKP Filter. With the system, engineers can easily configure a measurement environment for early-stage development of PCIe 5.0 IP and devices, expediting the rollout of technology.

The MP1900A will be featured in other demonstrations on verifying high-speed designs. It will be integrated with the BERTWave™ MP2110A and MS9740B OSA to conduct 400G optical PAM4 TDECQ tests, as well as in a configuration to conduct automated high-speed serial bus RX tests.

Anritsu’s leadership in vector network analyzer (VNA) technology will also be on display at DesignCon 2020. The ShockLine™ MS46524B 4-port VNA will conduct de-embedding and network extraction measurements, and the VectorStar™ MS4640B will be in a 110 GHz signal integrity measurement configuration for more efficient device modeling.

Network Technologies Panel

Anritsu High-speed and optical product and business development manager Hiroshi Goto will participate in a panel discussion on the state of testing high-speed network technologies. Entitled The Case of the Closing Eyes: PAM is the Answer, or Not?, the event is scheduled for Tuesday, January 28, at 4:45 PM in ballroom F. Goto and other panelists will evaluate the pros and cons of characterization efforts for 400GbE over PAM4.

Technical Sessions

Further discussion on conducting accurate evaluations of high-speed designs will be held on Thursday, January 30, in Great America – Room 2. Anritsu will lead a series of technical sessions addressing emerging test considerations, including:

Characterizing O/E Components – One session will discuss techniques to accurately characterize opto-electronic (O/E) and electro-optical (E/O) components, considered the building blocks of  communication systems, and crucial elements for next-generation networks to work seamlessly.

PCIe 4.0/5.0 Tx/Rx LEQ Compliance Test – Held in conjunction with Teledyne LeCroy, the talk will give engineers an understanding of the PCIe test specifications, detailed test procedures, and optimal test equipment configurations to ensure their products pass PCIe 3.0/4.0 TX/RX compliance testing. A PCIe 5.0 test solution will also be introduced.

PCIe 4.0/5.0 SerDes Test – This session will discuss how PCIe addresses challenges associated with making 32 GT/s function with NRZ signaling. It will include descriptions of the technology complemented with detailed guidance through the crucial SerDes tests.

400G BER and Jitter Tolerance Test for 53 Gbaud PAM4 with FEC – Anritsu will present the latest test techniques and requirements of the PAM4 400GbE standards. The focus will be on 100G PAM4 signal integrity, jitter tolerance test, ISI injection/emulation, and error distribution analysis to determine how error(s) can be corrected by FEC (Forward Error Correction). Subsequently, Anritsu will conduct a live demo of 100Gbps PAM4 BER and FEC Error Analysis.