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Recently, Signal Integrity Journal connected with Martin Stumpf, market segment director for Electronics and Component Testing at Rohde & Schwarz, to talk about current test and measurement trends and challenges facing the industry. Learn more from the executive one-on-one.
Samtec announces the release of the two new FireFly™ FMC+ Development Kits. The first supports data rates of 25 Gbps per channel while the second runs at 28 Gbps per channel. Follow the link to learn more about these new solutions that offer evaluation and development platforms for Samtec’s FireFly optical engines.
LPKF Laser & Electronics will be demonstrating its in-house rapid PCB prototyping equipment at the EDI CON 2018 exhibition, which takes place October 17th-18th at the Santa Clara Convention Center in Santa Clara, CA. Read on to find out more about the system's capabilities and when to catch the demo.
By CST
This whitepaper highlights the key features for SerDes Channel Design in CST STUDIO SUITE® including the new eye diagram tool, demonstrating realistic transmitter and receiver models including jitter, modulation and equalization at both the pre-layout and post-layout stage.
EDI CON USA, the industry event that brings together RF/microwave and high speed digital design engineers and system integrators, is thrilled to announce its plenary keynote speakers who will address the surprising power of innovation to change the way we view and interact with our world. This year, EDICON USA will be held in Santa Clara, Calif. October 17 and 18. Learn more about the details of these keynote talks and start planning your event schedule.
GaN offers many advantages compared to silicon MOSFETS, including smaller size, lower on state resistance, more stable gate voltage, much lower capacitance resulting in higher speed, lower inductance connection inductance and manufacturable using existing silicon wafer fabs and the promise of lower cost. With all of these benefits, mass adoption should be instantaneous, right? Yet, engineers are slow to change, in part due to a lack of credible information and in part due to fear of the unknown. It’s not too late to register! Join us TODAY at 11am EST.
Visit our archived webinars page for educational resources on various design and measurement subjects and view at your convenience. Browse webinars here.
