Items Tagged with 'test'

ARTICLES

Zuken Announces XJTAG DFT Assistant for CR-8000 PCB Design Suite

Zuken® and XJTAG®, a leader in boundary scan and design for test technology, have entered into a partnership to enhance Zuken’s CR-8000 with a design for test (DFT) capability that will improve test coverage during schematic entry. The capability is based on XJTAG’s DFT Assistant, and will be available later this year as a free plugin for Zuken’s CR-8000 Design Gateway users.


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Tektronix Provides Raspberry Pi with Measurement Solutions to Test and Develop Current and Next Generation High Speed Interfaces

Tektronix, Inc., a leading worldwide provider of measurement solutions, announced it will fully outfit the Research and Development (R&D) lab for Raspberry Pi, a low-cost, high performance computer designer with the latest Tektronix high-speed test solutions. Raspberry Pi’s new laboratory will focus on high speed serial design and validation testing. The new test equipment from Tektronix delivers on their needs today while also ensuring enough bandwidth to support any future high speed interfaces that would require the highest performance instrumentation.  


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Teledyne LeCroy, Coherent Solutions, Anritsu and Oclaro showcase latest 400G test platform at OFC 2016

Teledyne LeCroy, Anritsu Company, Coherent Solutions Ltd. and Oclaro, Inc.  announced a new joint effort to demonstrate the highest performance single-carrier 16QAM signal generation and analysis capabilities available at 56Gbaud. The demonstration of the partners’ latest optical communications test equipment platform takes place at OFC 2016 in Anaheim, CA, USA in the Teledyne LeCroy booth #1115.


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R&S RTO Oscilloscope Offers New Test Options for Fast Serial Interfaces up to 5 Gbit/s

Fast serial communications interfaces such as USB and PCIe have found their way into the designs of many electronic circuits. When testing and debugging circuits, developers need easy-to-use tools that provide comprehensive support for these interfaces. The most compact complete solution available today is offered by Rohde & Schwarz and consists of the following components: the R&S RTO2064 oscilloscope, the test options for the various interface standards, and modular R&S RT-ZM60 broadband probes for contacting the DUT. Rohde & Schwarz is expanding its offering with the following new test options: triggering and decoding software options for SuperSpeed USB (USB 3.1 Gen1), PCIe 1.1/2.0 and USB-PD, plus a compliance test option for PCIe 1.1/2.0.


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Rohde & Schwarz Introduces a Modular Probe System for Precision Measurements up to 9 GHz

Measuring fast data signals, e.g. on SuperSpeed USB or PCIe-2.0 interfaces, requires an oscilloscope that can acquire and analyze data rates up to 5 Gbit/s and suitable probes. The new R&S RT-ZM modular broadband probe system from Rohde & Schwarz ensures that optimum contact is made with the DUT. It provides a high dynamic range and, depending on the tip and test mode, an extremely low input capacitance of 32 femtofarad to 521 femtofarad up into the GHz range.


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