Items Tagged with 'test'

Introspect Technology announced that it has shipped the M5512 GDDR7 Memory Test System, the world’s first commercial solution for testing JEDEC’s newly minted JESD239 GDDR7 SGRAM specification.

In recent years, the IEEE Electrical Packaging Society technical committee for electrical design, modeling, and simulation recognized the need for open-source benchmarks for the simulation tool, verification, and test and measurement solution vendors. The intention is to overcome the obstacles that developers and users of such tools and instruments often encounter and create a growing library of benchmark cases for signal and power integrity challenges. As of October 2023, there are four published benchmark cases in the repository. This article describes a proposal for a fifth benchmark.

Keysight Technologies, Inc. and Credo Semiconductor set a new milestone by developing a joint testbed that demonstrates the first IEEE P802.3dj draft specification compliant 1.6 terabit Ethernet measurement system running full line rate layer 2 Ethernet traffic on a real world hardware development platform.

VIAVI has announced that it will be showcasing its latest network testing solutions that address the demanding requirements of AI applications at OFC 2024.

Keysight Technologies, Inc. leveraged 4th generation AMD EPYC CPUs from Advanced Micro Devices, Inc. to develop an industry first benchmarking methodology that redefines the landscape of system performance evaluation for high-speed digital designers, network equipment manufacturers, and data center operators.

For both device developers and conformance test houses the R&S EPL1000 EMI test receiver offers fast, accurate, and reliable EMI compliance measurements up to 30 MHz at the best price in its class.

Keysight Technologies, Inc. has entered the AI and ML infrastructure ecosystem with the introduction of the Keysight AI Data Center Test Platform, designed to accelerate innovation in AI/ML network validation and optimization.

Phase-locked loops (PLL) are used extensively throughout modern electronic systems. In data communication systems, PLLs are used in transmitter clock multipliers and receiver clock recovery circuits. A key performance factor for the PLL is how they manage jitter. A critical PLL metric is the jitter transfer function which is based on the PLL loop bandwidth. There are several measurement methods that can be used to characterize PLL loop bandwidth and jitter transfer. When operating on digital data signals, PLL bandwidth can vary with the data pattern. In this article, Greg Le Cheminant, Keysight Technologies, focuses on test methods that allow operation on data rather than only clock signals provide very high precision and useful insights into PLL behavior.

Spirent Communications plc has announced the industry’s first high-density test solution capable of emulating realistic AI workloads over Ethernet.

DesignCon, the premier high-speed communications and system design conference, returns to its home at the Santa Clara Convention Center in Santa Clara, Calif., with technical paper sessions, tutorials, industry panels, product demos, and exhibits, January 30 to February 1, 2024. Group Event Director Suzanne Deffree reflects on the resources, networking, and innovation that DesignCon 2024 will bring.