Items Tagged with 'test'

Zuken® and XJTAG®, a leader in boundary scan and design for test technology, have entered into a partnership to enhance Zuken’s CR-8000 with a design for test (DFT) capability that will improve test coverage during schematic entry. The capability is based on XJTAG’s DFT Assistant, and will be available later this year as a free plugin for Zuken’s CR-8000 Design Gateway users.

Tektronix, Inc., a leading worldwide provider of measurement solutions, announced it will fully outfit the Research and Development (R&D) lab for Raspberry Pi, a low-cost, high performance computer designer with the latest Tektronix high-speed test solutions. Raspberry Pi’s new laboratory will focus on high speed serial design and validation testing. The new test equipment from Tektronix delivers on their needs today while also ensuring enough bandwidth to support any future high speed interfaces that would require the highest performance instrumentation.  

Teledyne LeCroy, Anritsu Company, Coherent Solutions Ltd. and Oclaro, Inc.  announced a new joint effort to demonstrate the highest performance single-carrier 16QAM signal generation and analysis capabilities available at 56Gbaud. The demonstration of the partners’ latest optical communications test equipment platform takes place at OFC 2016 in Anaheim, CA, USA in the Teledyne LeCroy booth #1115.