Articles Tagged with ''test & measurement''

Optimizing DDR5 memory system validation involves a strategic focus on probe and interposer solutions for in-system measurements. The selection of probe architecture, whether RC or RCRC, plays a key role in managing probe loading. To make the right choice, evaluating source impedance and signal characteristics, especially for bursted signaling, is essential. As DDR5 continues to evolve at higher speeds and reach its top speed phase, integrating non-ideal loading modeling within simulations and effectively de-embedding probe and interposer effects become critical components of a comprehensive testing plan.s

Spanning DC to 90 GHz, Samtec's new connectors are well suited for use in high frequency test and measurement applications and are available in full production quantities.

Emerson announced it has closed its acquisition of NI, provider of software-connected automated test and measurement systems, at an equity value of $8.2 billion.

In this article covering next-generation USB technology, Keysight reviews IP/PHY development kits, simulation solutions, and T&M solutions that serve as the foundation for silicon and system integrators to design compliant USB4 Version 2.0 products that meet strict interoperability requirements in the vast Type-C ecosystem.

At DSEI Japan, Teledyne SP Devices demonstrated the industry’s first implementation of peer-to-peer streaming between commercial-off-the-shelf digitizers and GPUs in PXIe Systems.

EDI CON China 2020, held at the CNCC in Beijing, the finalists and winners of the EDI CON Product Innovation Awards were announced in three categories: Cables, Connectors & Materials; Semiconductors; and Test & Measurement.