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The IEEE P370 standards group was formed over four years ago to draft a standard for the Electrical Characterization of PCB interconnects up to 50 GHz. On Monday, Jan 30, 2018, more than 30 engineers attended the organization’s first “plug fest” at the Santa Clara Convention Center to exercise some of the features of the proposed standard.
Signal Integrity Journal was onsite at DesignCon last week, and in the heart of the signal integrity, power integrity, EMC/EMI discussions on the show floor, handing out our new print edition, and various other gifts and prizes. Check out this photo gallery taken by the SIJ team.
Bogatin’s Rule #9 is “Never do a measurement or simulation without first anticipating the results. If you see something unexpected, don't proceed with the result until you can understand why it doesn’t match your expectation.” Learn more.
Selecting printed-circuit-board (PCB) materials that support modeling with modern computer-aided-engineering (CAE) simulation software and help achieve excellent signal integrity (SI) for high-speed digital circuits usually starts with key material parameters, such as dielectric constant or Dk. Read more.
Keysight Technologies Inc. announced it has reached a new milestone in low-frequency noise measurements through its work with leading research centers in Europe, Middle East, Africa and India (EMEAI). Using the new (A-LFNA) and WaferPro Express software, designers can now measure noise more accurately in an even broader range of electronic devices.
TDK Corporation has expanded the ALT4532 series of pulse transformers with new types for Gigabit Ethernet and Power over Ethernet (PoE) applications. The new ALT4532P type is designed for emerging 2.5GBASE-T (2.5 Gbit/s) and 5GBASE-T (5 Gbit/s) LAN applications as well as 1000BASE-T (1 Gbit/s) applications with 600-mA PoE.
This presentation proposes using a pulse echo for time domain reflectometry (TDR) rather the commonly used step function echo. The echoed pulse response of a single symbol is convolved with the modulation signal levels to produce an effective reflection coefficient metric at a specified bit error ratio (BER). Learn more.
Visit our archived webinars page for educational resources on various design and measurement subjects and view at your convenience. Browse webinars here.
