July 11, 2017
Test-Fixture De-Embedding 101
De-embedding makes the murky waters between the SI engineer and the DUT clear by removing the fixture from the measurement. Read about the basics here.
New Blog Series – “For Good Measure”
DDR Memory Interface Basics
In this DDR 101 introductory piece, learn about the fundamentals of a DDR interface and some basics of physical-layer testing.
High Speed Digital Symposium Launches at EDI CON USA 2017
Day two of the three-day conference includes an afternoon symposium on material characterization challenges in high-speed digital design led by session chair Eric Bogatin.
72 V Fixed-Ratio DC/DC Controller Eliminates Power Inductor
A high-power fixed ratio charge pump DC/DC controller that eliminates the power inductor in a non-isolated intermediate bus converter, allowing up to a 50 percent reduction in circuit size and up to 4000 W/in³ power density.
Webinar: Signal Integrity and Electromagnetic Interference Modeling of a Smartwatch
In this webinar, CST will demonstrate how structural and electromagnetic simulation tools can be used to co-design many functional aspects of a smartwatch including connector SI/RF considerations and EMI compliance.
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