July 11, 2017

Sponsored by: EDI CON USA


Featured Article

Test-Fixture De-Embedding 101

By Jason Ellison, SI Engineer, The Siemon Company

De-embedding makes the murky waters between the SI engineer and the DUT clear by removing the fixture from the measurement. Read about the basics here.


New Blog Series – “For Good Measure”
Covering SI/PI, Test & Measurement Topics

Featured Article

DDR Memory Interface Basics

By David Maliniak, Teledyne LeCroy

In this DDR 101 introductory piece, learn about the fundamentals of a DDR interface and some basics of physical-layer testing.



High Speed Digital Symposium Launches at EDI CON USA 2017
By EDI CON 2017

Day two of the three-day conference includes an afternoon symposium on material characterization challenges in high-speed digital design led by session chair Eric Bogatin.


News 2

72 V Fixed-Ratio DC/DC Controller Eliminates Power Inductor
By Analog Devices Inc. and Linear Technology Corp.

A high-power fixed ratio charge pump DC/DC controller that eliminates the power inductor in a non-isolated intermediate bus converter, allowing up to a 50 percent reduction in circuit size and up to 4000 W/in³ power density.




How to Accurately Model a Multi-Gigabit Serial Link 10 Times Faster
By Cadence Design Systems Inc.

In this video, learn how to model serial link interfaces using a cut-and-stitch methodology which enables creation of 3D full-wave accurate s-parameter models 10 times faster than traditional approaches.

Signal Integrity Webinar

Webinar: Signal Integrity and Electromagnetic Interference Modeling of a Smartwatch
July 18 - 8 am PT / 11 am ET
Sponsored by CST

In this webinar, CST will demonstrate how structural and electromagnetic simulation tools can be used to co-design many functional aspects of a smartwatch including connector SI/RF considerations and EMI compliance.

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