Signal Integrity Journal, covering signal integrity, power integrity and EMC/EMI, has published its October 2025 issue. The magazine is available in print (by subscription and at select SI/PI/EMI events) and is also available as a technical eBook.

Subscribe or login to download the latest issue of Signal Integrity Journal featuring articles from industry experts including:

  • "The Impact of AI at the Singularity," Eric Bogatin, Signal Integrity Journal
  • "Optimization of IBIS-AMI Model Parameters with Machine Learning Algorithms," Jared James and Ambrish Varma, Cadence Design Systems
  • "The Imperfect Via: The Rough Truth Lurks Beneath the Surface," Bert Simonovich, Lamsim Enterprises
  • "High-Speed Digital Interface Characterization Requires New Test Approach," Hiroshi Goto, Anritsu Company
  • "Using Ultra-Broadband Baluns to Perform Differential S-Parameter Measurements Using Single-Ended 2-Port VNA," Madrone Coopwood, Jason Yoho, and James R. Andrews, HYPERLABS
  • "Material-Induced Skew in High-Speed Multilayer PCBs: Influences and Mitigation Strategies," Bob Nurmi, John Coonrod, and Vitali Judin, Rogers Corporation
  • "Seeing Through the Noise: Reliable Power Rail Measurements in High-Current AI Systems," Seamus Brokaw, Tektronix, and Steve Sandler, Picotest
  • "ManyPoint Networks: A System Co-Design Framework for 448 Gbps AI Fabrics and Beyond," Andrew Josephson, Samtec

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