CAES introduced a line of RadHard NOR Flash Memory devices that deliver the boot-memory densities required by microprocessors and FPGAs used in space applications.

Keysight Technologies, Inc. announced an end-to-end PCIe test solution for digital development and senior engineers that allow the simulation, pathfinding, characterization, validation, and compliance testing of PCIe designs.

Keysight Technologies, Inc. has introduced a 120 Giga Baud (GBd) High-Performance Bit Error Ratio Test (BERT) solution (M8050A) for validating chip deployments of up to 120 GBd.