Items Tagged with 'Keysight Technologies, Inc.'

Keysight and researchers from France's CNRS, Lille University, and Osaka University have broken the 1 Tbps barrier. 

Scalable test platform generates both legitimate and malicious traffic at multi-terabit, hyperscale volumes, realistically emulating DDoS attack mitigation of carrier-grade network loads

Keysight has joined the TSMC Open Innovation Platform 3DFabric Alliance, which was formed recently by TSMC to accelerate 3D IC ecosystem innovation and readiness. 

In this article covering next-generation USB technology, Keysight reviews IP/PHY development kits, simulation solutions, and T&M solutions that serve as the foundation for silicon and system integrators to design compliant USB4 Version 2.0 products that meet strict interoperability requirements in the vast Type-C ecosystem.

Keysight Open RAN Architect validates ArrayComm’s open distributed unit using O-RAN ALLIANCE’s fronthaul conformance test specifications.

New tools complement existing e-mobility charging test portfolio with component-level and field testing solutions.

Keysight enhanced the x1149 Boundary Scan Analyzer with support for the new IEEE 1149.1-2013 and IEEE 1149.6-2015 standards, allowing advanced boundary scan testing beyond typical structural tests and significantly increasing test coverage on PCBs.

Solutions will test edge-to-core O-RAN subcomponents to verify interoperability and measure performance during competition.

Demonstration achieves the first 310 GBaud rates using on-off keying modulation and 160 GBaud rates using PAM6 modulation with direct detection systems.

Keysight will participate at embedded world 2023 to showcase how design, emulation, and test expertise can create the best embedded design experiences with intelligent insights to empower IoT networks, autonomous driving, and batteries.