We use cookies to provide you with a better experience. By continuing to browse the site you are agreeing to our use of cookies in accordance with our Cookie Policy.

×
Header logo
  • Sign In
  • Subscribe
  • Sign Out
  • My Account
Nav logo
  • News
  • Channels
    • Signal Integrity
    • Power Integrity
    • EMC/EMI
  • Elearning
    • Webinars
    • Archived Webinars & Events
    • eBook Library
    • White Papers
    • Sponsored Content
  • Events
    • Trade Shows
    • Webinars
    • Archived Webinars & Events
    • IEEE MTT-S IMS
    • EDI CON Online
    • EDI CON China
    • EDI CON Across China
  • Community
    • Blogs
    • Editorial Advisory Board
    • Signal & Power Integrity LinkedIn Group
    • LinkedIn
    • Twitter
    • Facebook
    • Instagram
  • Resources
    • Buyer's Guide
    • Podcasts
    • Authors
    • SI/PI/EMI Consultants
    • SI/PI Fundamentals
    • SnapEDA Free Models
    • Videos
    • Photo Galleries
    • Submit an Article
    • About Us
    • Contact Us
  • Advertise
    • Who Reads SIJ?
    • What Makes SIJ Different?
    • Deliverables for Digital Products
    • Sales Contacts
    • Media Kit
  • Print
    • Archived Issues
    • Subscribe
    • Latest Issue
Home » Authors » Wiley Gillmor

Wiley Gillmor

SiSoft
Articles

ARTICLES

Fig 2

How Design of Experiments Saved my CEI VSR 28G Design

August 15, 2016
Richard Allred, Ishwar Hosagrahar, Chao Xu, and Wiley Gillmor
No Comments

This paper will demonstrate the application of DOE and RSM to a CEI 28G VSR design. We will show the process of creating a DOE, fitting the data to models, determining the goodness and reliability of the fit and then using the model to perform “what if” analysis, optimize design factors and quantify the impact of manufacturing variation. 


Read More
  • Free Newsletter
    • Subscribe Now

Buyer's Guide

LogoVisit Buyer's GuideGet Your Company Listed

Popular Posts

  • Coupled Transmission Lines and Crosstalk
  • DC-DC Converters – Solid Return Plane or Cutouts Under Switch Node and Inductor?
  • PCB Signal Traces Are Hotter Than We Think
  • Ultra-Ultra-Low Impedance (4 micro-ohm) Measurements
  • IBIS-AMI Modeling and Correlation Methodology for ADC-Based SerDes Beyond 100 Gb/s

Featured Videos

Ims2022 video4

IMS 2022: Introduction to Quantic Electronics and Booth Walk Around

Ims2022 video3

IMS 2022 Interview: 5G Timing Solutions from Skyworks

See More Videos
  • COMPANY
    • About Us
    • Contact Us
    • Advertise with Us
    • Submit an Article
    • Privacy

SIGNAL INTEGRITY JOURNAL

685 Canton St. Norwood, MA 02062
Tel: (781) 769-9750 Fax: (781) 769-5037
email: editorial@signalintegrityjournal.com
EDI CON Online
Copyright Signal Integrity Journal
© 2022. All Rights Reserved
Design, CMS, Hosting & Web Development | ePublishing