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Chun-ting "Tim" Wang Lee, Ph.D., a Signal Integrity Application Scientist at Keysight Technologies, brings clarity to the complexities of high-speed design. With a Ph.D. from the University of Colorado at Boulder, his expertise spans from understanding how circuit board fabrication affects simulation-to-measurement correlation. Working with his advisor, Dr. Eric Bogatin, Tim investigated the fundamentals of interconnect performance and pushed them to the limit. He has characterized advanced modulation schemes such as PAM4 and ENRZ and explored channel stress testing methodologies to reveal real-world system limits. Recognized as one of DesignCon’s 40-Under-40, Tim is known for presentations that make challenging signal integrity concepts approachable and actionable.