Hwanwoo Shim

Hwanwoo Shim is a principal engineer at Mobile Communication Business Division, Samsung Electronics. He has been working as a leader of CAE application team after more than ten years of experience as a project leader for commercial smartphone development. His technical interests include SI/PI simulations and noise modeling techniques to estimate EMI/RFI issues in early design stages. He received Ph.D. from Missouri S&T EMC laboratory and M.S. from Korea Advanced Institute of Science and Technology (KAIST), Daejeon Korea.



RFI and Receiver Sensitivity Analysis in Mobile Electronic Devices

Receiver sensitivity and noise coupling to antenna are two major concerns when developing mobile devices such as smart phones and tablets. There are various causes of degradation of receiver sensitivity. However, most of the time they are due to the noise generated by digital signal harmonics on printed circuit board (PCB) patterns, which couple to the antennas. This article presents a methodology to predict noise to antenna coupling and antenna desense.

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