As 400G Moves into Production, Tektronix Leads the Way to Improved Production Yields and Throughput with New Optical Modules for DSA8300 Sampling Oscilloscope. 

Tektronix, Inc., a provider of measurement solutions, today introduced two new optical modules for its DSA8300 sampling oscilloscope that offers the highest sensitivity and lowest noise, giving manufacturers the confidence they need to increase production capacity and improve yields for 400G designs moving into production. Tektronix also announced enhanced support for the latest 400G PAM4 TDECQ measurements with a software package optimized for 4 channel parallel processing for high throughput manufacturing test.

The new modules and capabilities, along with the full set of Tektronix solutions for 100G/400G optical characterization and validation, are being demonstrated at the OFC optical networking and communication conference and exhibition taking place this week in San Diego, Calif. Tektronix also introduced a new 56 GBd single mode optical probe for its DPO70000SX real-time oscilloscope at the event (see separate release).

“As 400G designs move into production, our customers are looking for ways to improve manufacturing yield and cost of test, which all starts with confidence in test results and the ability to quickly and accurately separate good components from bad ones,” said Sarah Boen, general manager, Performance Oscilloscopes, Tektronix. “With the industry’s lowest noise and highest sensitivity, our solution delivers insights that improve yields and throughput on optical components and interconnects.”

When installed in DSA8300 sampling oscilloscopes, the new 80C20 and 80C21 optical modules for 56 GBd PAM4 and NRZ offers notable noise performance with 9 µW optical noise. The two-channel 80C21 enables optical manufacturing test engineers to double throughput and capacity. If a device fails, Tektronix offers a comprehensive set of enhanced PAM4 analysis tools to decompose signal content for noise and jitter to help engineers understand the underlying problem.

To keep pace with demands for more bandwidth in datacenters, the optical industry is rapidly making the move to 400G and PAM4. However, production engineers face challenges to keep per device test cost low due to lower signal to noise ratio, reduced signal amplitude and a more than 10x increase in the number of tests. Tektronix DSA8300-based sampling solutions help lower test costs with the industry’s highest bandwidth, highest sensitivity and with shortened test times. 


The 80C20 and 80C21 optical modules and 400G test software enhancements will be available beginning in April 2018. For ordering information contact a local Tektronix representative. For complete solution details go to: