January 24, 2018 (Norwood, Mass.) – Signal Integrity Journal, a sister publication to Microwave Journal covering signal integrity, power integrity and EMC/EMI related topics, has published its first printed magazine issue. Signal Integrity Journal was launched in September 2016 as an online magazine, and is now celebrating its success with this 2018 print edition (which is also available as a digital e-book).

The Signal Integrity Journal 2018 print edition features articles from leaders in the industry such as Signal Integrity Journal editor Eric Bogatin (University of Colorado/Teledyne LeCroy), and Isvan Novak, (Oracle), Steve Sandler, (Picotest), Al Neves (Wild River Technology), and Bert Simonovich, (LAMSIM). The issue has long form technical articles on signal integrity, power integrity and EMC/EMI subjects plus shorter form columns covering these topics with practical, expert advice about designing high-speed circuits for optimal performance at the lowest cost. This in-depth content is sure to be referenced over and over again, and shared amongst SI/PI/EMI engineers.

The magazine issue is available in print, distributed at worldwide SI/PI/EMI events, and as a .pdf download online at www.signalintegrityjournal.com/2018magazine. Signal Integrity Journal will be exhibiting at the DesignCon 2018 Expo in booth T1 January 31-February 1 at the Santa Clara Convention Center in Santa Clara, Calif. Visit the booth for a free copy of this first edition of Signal Integrity Journal plus giveaways including T-shirts and a drawing for a SI/PI book library. In addition to distribution at DesignCon 2018, the magazine will be distributed throughout 2018 at other events including EDI CON China, EDI CON USA, IEEE EMC/SI/PI, and others.

About Signal Integrity Journal

Signal Integrity Journal is the first peer reviewed, industry journal covering the signal integrity, power integrity and EMC/EMI industries. The publication is now fully released and a weekly e-newsletter is being distributed to registrants. Signal Integrity Journal and Microwave Journal are the official publications of Electronic Design Innovation Conference (EDI CON) USA and EDI CON China, industry-driven conferences and exhibitions covering RF/microwave, high-speed digital and EMC/EMI related topics. Please visit www.signalintegrityjournal.com for more information and join the community. To submit an article, send an abstract to editorial@signalintegrityjournal.com.


Carl Sheffres, Publisher


Pat Hindle, Contributing Editor
+1 781 619 1946
Twitter: @pathindle

Janine Love, Contributing Editor
Twitter: @tb_janine