SIGLENT Technologies has introduced a new flagship oscilloscope, the SIGLENT SDS5000X. Available with bandwidths of 350, 500, and 1 GHz, and featuring a maximum sample rate of 5 GS/s, the SDS5000X is fast enough to capture the most elusive measurements. It also features 250 Mpts of acquisition memory and a waveform-update rate of up-to 110,000 wfm/s. To help maintain high test speeds, many of its waveform analysis features are implemented in hardware.
The SDS5000X includes a full digital trigger with qualified and zone triggering to help isolate faults more quickly. This technique enables a highly sensitive and accurate trigger control. It also includes a new low noise front end that delivers an industry leading vertical sensitivity of 500 µV/div, making this new scope ideal for debugging small signals. It features powerful data analysis and measurement features designed to solve the complex challenges of embedded circuit design.

One of the best features of this innovative platform is usability. The scope includes a large responsive 10.1” touch screen that includes smooth gesture operation and a clear layout that makes the scope extremely easy-to-use. For example, setting up the zone trigger is as simple as drawing a target around the waveform with a finger. For multi-domain analysis, the oscilloscope has hardware-based frequency analysis utilizing up-to 2 Mpts for the FFT-calculation. This deep memory FFT provides higher frequency resolution than many other FFT0-based systems. Furthermore, the SDS5000X can be upgraded to include MSO/16 digital channels and an external 25 MHz arbitrary waveform generator at any time.
For serial bus troubleshooting, the SDS5000X includes free decoding on all low speed serial buses (RS232, CAN, LIN, and I2C) and can be upgraded with decoding kits for more specialized buses (CAN-FD, I2S, FlexRay and MIL1553B) at any time. The scope also features bandwidth upgrade options that provide flexibility and performance at a breakthrough price. SDS5000X-E series oscilloscopes start at $2899.
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