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EDI CON Online: The Influence of Connectivity on Low Impedance Measurements

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When

8/25/21 12:30 pm to 8/25/21 1:00 pm EDT

Event Description

EDI CON Online

Title: The Influence of Connectivity on Low Impedance Measurements

Date: August 25, 2021

Time: 9:30am PT / 12:30pm ET

Presented by: Steven M Sandler, Managing Director, Picotest

Abstract:
Engineers connect a VNA to a circuit board for low-impedance measurements using a variety of methods.

These methods primarily include connectors, probes, and soldered pigtails. Each of these methods has advantages and disadvantages, and no one solution is best in all cases. In this session both qualitative and quantitative assessments are presented for each method, highlighting the limitations, and providing tips to optimize the measurement accuracy. In addition to connectivity on the probe side of the measurement, the PCB side is also considered and several options for connectivity are presented.

Presenter Bio:

Steve Sandler has been involved with power system engineering for more than 40 years. Steve is the founder and CEO of PICOTEST.com, a company specializing in instruments and accessories for high performance power system and distributed system testing. Steve is also the founder of AEi Systems, a company specialized in worst case circuit analysis for high reliability industries.

He frequently lectures and leads workshops internationally on the topics of Power Integrity and Distributed Power System Design. He is a Keysight Certified EDA expert. Steve is also a recent Winner of the Jim Williams ACE Award for Contributor of the Year (2015) and a 2-time Test & Measurement Test Engineer of the Year Finalist. He was the recipient of both the DesignCon 2017 and EDICON 2017 Best Paper Awards.

 

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