Articles by Pico Technology

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Decoders for PicoScope: SMBus and SBS Data

The Pico Technology serial decoders team have been working overtime, adding another protocol to both PicoScope 6 (Stable) and PicoScope 7 (Early Access) implementations: MIPI I3C Basic specification waveforms can now be decoded, displayed, and analyzed on any PicoScope with sufficient bandwidth and memory depth.


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Extended Range of PicoScope 6000E Series Oscilloscopes

Pico Technology announced the development of its PicoScope 6000E Series oscilloscopes with the launch of three 4-channel models, each of which can be configured with 16 optional digital channels. With bandwidths of 300 or 500 MHz, 8-bit or 8/10/12-bit Flexible Resolution and up to 4 GS deep capture memory, these products enhance the existing PicoScope 6000E portfolio, adding to the 8-channel models that were introduced earlier in the year.


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Pico Technology Increases the Bandwidth of its PicoScope 9300 Family of Sampling Oscilloscopes

Pico Technology has increased the bandwidth of its PicoScope 9300 family of Sampling Oscilloscopes with two new 25 GHz models.  The USB-controlled Sampling Oscilloscope, available only from Pico, stands as one of very few low-cost, high-integrity options for viewing and measuring RF and microwave signals, paths and networks. Sampling Oscilloscopes are the cost-effective solution to today’s proliferation of gigabit-per-second datastreams and their copper, wireless and optical fiber interconnect.


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Pico Technology's New Scope Offers Four True Differential Channels

Pico Technology, market leader in PC oscilloscopes and data loggers, today introduced the PicoScope 4444 high-resolution differential oscilloscope. This instrument features four true differential input channels and a range of accessories for measurements from millivolt to 1000 V CAT III applications. The new PicoScope addresses the perennial problem of making accurate voltage waveform measurements on circuit elements that are not ground-referenced, without the risk of short circuits that could damage the device under test or the measuring instrument.


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