We use cookies to provide you with a better experience. By continuing to browse the site you are agreeing to our use of cookies in accordance with our Cookie Policy.

×
Stay Connected :
  • Login
  • Logout
Signal Integrity Journal
Signal Integrity Journal
Subscribe
Nav logo
  • News
  • Channels
    • Signal Integrity
    • Power Integrity
    • EMC/EMI
  • Elearning
    • Webinars
    • Archived Webinars & Events
    • eBook Library
    • White Papers
    • Sponsored Content
    • SIJ University
  • Events
    • Trade Shows
    • Webinars
    • Archived Webinars & Events
    • EDI CON Online
    • DesignCon
  • Community
    • Blogs
    • Editorial Advisory Board
    • Signal & Power Integrity LinkedIn Group
    • LinkedIn
    • Twitter
    • Facebook
    • Instagram
  • Resources
    • Buyer's Guide
    • Podcasts
    • Authors
    • SI/PI/EMI Consultants
    • SI/PI Fundamentals
    • SnapEDA Free Models
    • Videos
    • Photo Galleries
    • Submit an Article
    • About Us
    • Contact Us
  • Advertise
    • Media Kit/Deliverables
    • Sales Contacts
  • Print
    • Archived Issues
    • Subscribe
    • Latest Issue
Home » Authors » ProPlus Design Solutions Inc.

ProPlus Design Solutions Inc.

Articles

ARTICLES

pro-plus9812DX-sig-int.jpg

ProPlus Design Solutions Sets New Standard for 1/f Noise Measurement Systems

November 30, 2016
ProPlus Design Solutions Inc.
0 Comments

ProPlus Design Solutions Inc.  unveiled 9812DX™ wafer-level 1/f noise characterization system, an enhanced version of its de facto standard 9812D™, setting records for measurement speed, system resolution and coverage of different types of measurement requirements.


Read More
Sign up for Signal Integrity Journal Newsletters
Subscribe

Buyer's Guide

With our Buyer's Guide, you can find vendors for the latest in RF and microwave article highlights, products and news direct from the listed companies.
Featured Listing
Logo

Get Listed In The Directory

Popular Posts

  • 4287 When Frequency Shapes Time.png

    When Frequency Shapes Time: How S-Parameter Properties Shape Simulated TDR Behavior

  • 4288 PAM2 vs. PAM4.png

    PAM2 vs. PAM4 Signaling: Simply Explained

  • SIJ-APRIL-650-x-488.jpg

    SIJ Publishes April 2026 Issue

Featured Videos

Pcie 6 link training analysis

PCIe 6.0 Link Training Analysis

See More Videos

Featured products

  • LCBB Molex.png

    Molex Unveils Multi-Channel Liquid Cooled Busbar Capability at Computex 2026 to Power Next-Generation AI Data Centers

    By Molex LLC
  • Pulse 600x400.png

    Signal Hound Adds Pulse Analysis Tool Kit to Spike

    By Signal Hound
  • Infineon CoolGan.png

    Infineon CoolGaN™ BDS 40 V G3 Family Delivers up to 82 Percent Footprint Reduction for Portable Power Designs

    By Infineon and Infineon Technologies AG
  • Spectrum 600x400.png

    New AWG Function Accelerates Automated Testing Processes

    By Spectrum Instrumentation Corp.
Signal Integrity Journal
685 Canton St. Norwood, MA 02062
Tel: (781) 769-9750
email: [email protected]
NAVIGATION
  • Contact Us
  • Advertise with Us
  • Submit an Article
  • Privacy
  • About Us

Home
About Us
Contact Us
Privacy

USERS
  • Online Subscriber Service Center
  • Register
  • Sign In
Copyright Signal Integrity Journal
© 2026. All Rights Reserved
Design, Cms, Hosting & Web Development | ePublishing
microwavejournal

horizonhouse