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Based on MEMS switches, the modules are designed to simulate common faults in high-speed communication protocols, supporting the latest evolution of MultiGBASE-T1 testing requirements.
Pickering Interfaces will showcase its range of industry-standard modular signal switching and sensor simulation solutions for electronics test and verification — including the launch of its new PXI/PXIe MEMS-based MultiGBASE-T1 FIUs — at Automotive Testing Expo North America 2025.
