Title: A Three-Step Process for Radiated Emissions Troubleshooting Success
Date: September 11, 2019
Time: 7:30am PT / 10:30am ET
Presented by: Ken Wyatt, Principal Consultant, Wyatt Technical Services, Inc.
Radiated emissions is usually the most common EMI failure for product desigers and many will dread having to tackle this often project-delaying and costly challenge. Most engineers know about probing with near-field probes, but are at a loss as to what to do next with the information? I’ve developed a simple three-step process using near-field probes, current probes, and a nearby antenna to successfully troubleshoot hundreds of client projects. With a little knowledge and the right tools, you should be able to reduce the time in troubleshooting and mitigating radiated emissions from several weeks to a few days.
Ken Wyatt, principal consultant, Wyatt Technical Services, Inc., holds degrees in biology and electronic engineering and has worked as a product development engineer for 10 years for various aerospace firms on projects ranging from DC-DC power converters to RF and microwave systems for shipboard and space platforms. For over 20 years, he worked as a senior EMC engineer for Hewlett-Packard and Agilent Technologies in Colorado Springs where he provided comprehensive EMC design and troubleshooting services. During that time, he developed and provided advanced EMC training and corporate leadership for EMC. Ken is a senior member of the IEEE and a long time member of the EMC Society where he served as their official photographer for 10 years.
A prolific author and presenter, he has written or presented topics including RF amplifier design, RF network analysis software, EMC design and troubleshooting of products and use of harmonic comb generators for predicting shielding effectiveness. His specialty is EMI troubleshooting and is a co-author of the popular EMC Pocket Guide and RFI Pocket Guide. In 2014, he coauthored the book with Patrick André, EMI Troubleshooting Cookbook for Product Designers, with forward by Henry Ott.
To register for any EDI CON Online 5G/IoT or Radar/Antenna events, please visit the Microwave Journal website.
By registering, you are agreeing to allow the data collected to be shared with Microwave Journal®, Signal Integrity Journal™, the speakers & the sponsors of this event. You may be contacted regarding the subject matter presented.