Langer EMV-Technik is in the forefront of research, development, and production in the field of EMC. Through EMC experimental seminars and EMC workshops we offer our comprehensive knowledge to our customers.
Our interference emission and interference immunity EMC measurement technology as well as the IC test system are used mainly in the development stage and are in worldwide demand.
Developers and designers gain new perspectives and more efficient working strategies for module- and IC developments with the EMC know how and measurement technology of Langer EMV-Technik GmbH.
The individual pre-compliance consulting services provided by Langer EMV-Technik GmbH help developers and designers quickly find solutions to complex EMC problems in IC, device, and module development.
We make both our comprehensive EMC expertise and research results available to our customers via practical experimental EMC seminars and in-house events .
Langer EMV-Technik GmbH presents the world's first passive near-field probe with a measuring range of up to 40 gigahertz. The HR-E 40-1 probe is designed for measurements of high-frequency, electrical near fields in the frequency range up to 40 gigahertz on conductors, ICs, metallic housings, and RF structures.