Anritsu Company introduces a PCI Express test solution supporting the Gen5 base specification stressed receiver test featuring the Signal Quality Analyzer-R MP1900A series with installed automation software for base specification calibration and BER measurement software supporting the SKP Filter. With the release of this system, engineers can configure a measurement environment for early-stage development of Gen5 IP and devices, helping faster rollout of PCI Express 5.0 (PCIe 5.0).
The MP1900A has every pattern generation, error detection, jitter generation, and noise generation function required for PCI Express tests. Software expandable functions supporting PCI Express 1.0 (2.5 Gbit/s) to 5.0 (32 Gbit/s) help reduce infrastructure investment costs.
The MP1900A supports oscilloscopes from three main manufacturers for automation of measurement procedures for complex Rx tests. So end users can integrate the Anritsu PCI Express test solution into existing test systems to conduct measurements up to PCIe Gen5.
The PCI Express test solution can verify high-speed electronic devices, memory cards, graphic cards and components used in high-end servers and communication equipment under development to meet the high-speed transmission of large data in 5G applications, such as IoT and AI. With this release, Anritsu supports PCIe 5.0 Rx tests for IP and inspection of devices in the early standardization and development period with PCIe 1.0 – PCIe 5.0 measurement support. Easy expansion of measurement functions to meet emerging standards and trends helps product design inspection times.
Signal Quality Analyzer-R MP1900A Series
The Signal Quality Analyzer-R MP1900A Series is a multichannel BER tester meeting the design and verification requirements for high-speed bus interfaces, such as PCI Express 4.0/5.0, USB3.2/4, and Thunderbolt, as well as next-generation network interfaces, such as 200G/400G/800G Ethernet. The MP1900A has a built-in pulse pattern generator for generating high-quality waveforms with industry levels, such as Intrinsic Jitter of 115 fs rms, plus a high-input-sensitivity error detector. It also has a high-accuracy Jitter generation source (SJ, RJ, SSC, BUJ), CM-I/DM-I/White Noise source, link training function, and support for LTSSM analysis
It is well suited for various applications, including compliance tests, margin tests, and troubleshooting. Additionally, it supports PAM4 evaluation of PAM4 devices, including optical modules and NICs, used by 200G/400G/800G ethernet in data centers. Because a single instrument supports PCI Express and high-speed ethernet applications, various next-generation interfaces can be evaluated more cost-efficiently.